| Commit message (Collapse) | Author | Age | |
|---|---|---|---|
| * | showcase test | jpbruyere | 2017-05-27 |
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| * | reorganize tests and remove duplicates sources | jpbruyere | 2017-05-26 |
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| * | evdev Device class, test with keymapping | jpbruyere | 2017-05-25 |
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